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Metrology and Instrumentation

Scanning thermal probe method to map local thermal and thermoelectric properties with high spatial resolution

Research Approach

Metrology and instrumentation have been a strong driver for new scientific discoveries. Here, we focus on new thermal based metrology that can map local thermal and thermoelectric properties with nanoscale to microscale spatial resolution. These tools can be used to characterize nano/microscale materials, and map the properties of combinatorial properties to enable high-throughput materials discovery.

Ongoing projects:

DOE: Additive manufacturing of thermal sensors for in-pile thermal conductivity measurement